Yeast Homozygous Diploid Collection

The Yeast Knockout (YKO) Collection contains over 6,000 gene-disruption mutants as a unique tool for the functional analysis of the yeast genome.

Developed by the Saccharomyces Genome Deletion Project, the Yeast Knockout (YKO) Collection includes knock-out strains covering 96% of the yeast genome. The inclusion of distinct tags - or "molecular barcodes" - that identify each strain allows phenotypic analysis to be performed on a single gene basis or a genome-wide scale. By using the yeast knock out strains for functional profiling, one can also gather much information about human gene function by analogy.

Features
The yeast knock out strains were systematically created using a PCR-based strategy. By means of two sequential PCR reactions - the first to incorporate the appropriate tags and confer the antibiotic resistance gene and the second to incorporate the mitotic recombination sites - each ORF was replaced with a KanMX cassette using homologous recombination. Each cassette contains a unique 20 base pair nucleotide sequence of DNA known as a "molecular barcode" allowing for parallel analysis. Also incorporated is a common set of flanking DNA tag sequences allowing amplification of the unique tags.

Highlights

•     6,000 individual genes are represented in four backgrounds (haploids of MATa and MATalpha, heterozygous diploid, and homozygous diploid), thereby creating over 20,000 distinct knock out strains

•     Molecular barcodes allow for parallel analysis of gene function
•     The mutant yeast strains can also be analyzed individually via sequencing or by using a whole genome approach

A wealth of information - including genetic and physical maps along with DNA sequence information - is available from the Saccharomyces Genome Database (SGD) at Stanford University.

COMMON GENE IDENTIFIER

Note
We provide certain clone resources developed by leading academic laboratories. Many of these resources address the needs of specialized research communities not served by other commercial entities. In order to provide these as a public resource, we depend on the contributing academic laboratories for quality control.

Therefore, these are distributed in the format provided by the contributing institution "as is" with no additional product validation or guarantee. We are not responsible for any errors or performance issues. Additional information can be found in the product manual as well as in associated published articles (if available). Alternatively, the source academic institution can be contacted directly for troubleshooting.